User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: HP 3497A:Data Acquisition/Control Unit DATE: 18-Jul-97 AUTHOR: User Contributed REVISION: 0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 24 NUMBER OF LINES: 188 CONFIGURATION: Fluke 5700A CONFIGURATION: HP 34401A STANDARD: Leeds & Northrup 4035-B ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON # This procedure is run with the MET/CAL Configuration #2 loaded. # This procedure is derived from the Hewlett-Packard # manual dataed December 1992 and utilizes the 1 year # limits. 1.001 ASK- R F W 1.002 STD Leeds & Northrup 4035-B 1.003 HEAD INITIAL CONDITIONS 1.004 DISP Allow the UUT a ½ hour warm-up. 1.005 DISP Connect the system IEEE cabel from port 1 to the UUT 1.005 DISP IEEE connector. 1.006 HEAD {} 1.007 HEAD {* MAINFRAME SELFTEST *} 1.008 HEAD MAINFRAME SELFTEST 1.009 IEEE ST1[13][10][D3000] 1.010 IEEE [I] 1.011 IEEE STO[13][10] 1.012 MATH MEM1 = MEM - 800000000 1.013 JMPZ 1.017 1.014 RSLT =Self Test Fail 1.015 DISP Self Test has failed. UUT should be repaired before 1.015 DISP continuing with this test. This test will be terminated. 1.016 JMP 24.003 1.017 RSLT =Self Test Pass 1.018 ASK- P 1.019 ASK+ X 1.020 HEAD {} 1.021 HEAD {* DC VOLTMETER TEST *} 1.022 HEAD DC VOLTMETER TEST 1.023 JMP 2.001 1.024 EVAL 2.001 DISP Connect the 5700A HI/LO OUTPUTS to the UUT 2.001 DISP HI COM and LO COM inputs. 2.002 IEEE [SDC][D3000] 2.003 IEEE VR5[13][10] 2.004 5700 0.000000V S 2W 2.005 IEEE [I] 2.006 MEME 2.007 MEMC V 0.000003U Auto_Range #! Test Tol 3e-006, Sys Tol 7.5e-007, TUR 4.000 (>= 4.00). 3.001 HEAD {1 Volt Range} 3.002 JMP 4.001 3.003 EVAL 4.001 IEEE VR2[13][10] 4.002 5700 0.00000V S 2W 4.003 IEEE [I] 4.004 MEME 4.005 MEMC V 0.00001U #! Test Tol 1e-005, Sys Tol 7.5e-007, TUR 13.333 (>= 4.00). 5.001 5700 1.00000V S 2W 5.002 IEEE [I] 5.003 MEME 5.004 MEMC V 0.00016U #! Test Tol 0.00016, Sys Tol 7.2e-006, TUR 22.222 (>= 4.00). 6.001 HEAD {0.1 Volt Range} 6.002 JMP 7.001 6.003 EVAL 7.001 IEEE VR1[13][10] 7.002 5700 0.100000V S 2W 7.003 IEEE [I] 7.004 MEME 7.005 MEMC V 0.000018U #! Test Tol 1.8e-005, Sys Tol 1.45e-006, TUR 12.414 (>= 4.00). 8.001 HEAD {10 Volt Range} 8.002 JMP 9.001 8.003 EVAL 9.001 IEEE VR3[13][10] 9.002 5700 0.0000V S 2W 9.003 IEEE [I] 9.004 MEME 9.005 MEMC V 0.0001U #! Test Tol 0.0001, Sys Tol 7.5e-007, TUR 133.333 (>= 4.00). 10.001 5700 10.0000V S 2W 10.002 IEEE [I] 10.003 MEME 10.004 MEMC V 0.0016U #! Test Tol 0.0016, Sys Tol 5.4e-005, TUR 29.630 (>= 4.00). 11.001 IEEE VD4[13][10] 11.002 5700 10.000V S 2W 11.003 IEEE [I] 11.004 MEME 11.005 MEMC V 0.003U 4½_digits #! Test Tol 0.003, Sys Tol 5.4e-005, TUR 55.556 (>= 4.00). 12.001 IEEE VD3[13][10] 12.002 5700 10.00V S 2W 12.003 IEEE [I] 12.004 MEME 12.005 MEMC V 0.02U 3½_digits #! Test Tol 0.02, Sys Tol 5.4e-005, TUR 370.370 (>= 4.00). 13.001 HEAD {} 13.002 HEAD {Auto Zero Off} 13.003 IEEE VA0[13][10] 13.004 5700 10.0000V S 2W 13.005 IEEE [I] 13.006 MEME 13.007 MEMC V 0.0017U #! Test Tol 0.0017, Sys Tol 5.4e-005, TUR 31.481 (>= 4.00). 14.001 HEAD {} 14.002 HEAD {Auto Zero On} 14.003 IEEE VA1[13][10] 14.004 5700 1.0000V S 2W 14.005 IEEE [I] 14.006 MEME 14.007 MEMC V 0.0003U #! Test Tol 0.0003, Sys Tol 7.2e-006, TUR 41.667 (>= 4.00). 15.001 5700 -1.0000V S 2W 15.002 IEEE [I] 15.003 MEME 15.004 MEMC V 0.0003U #! Test Tol 0.0003, Sys Tol 7.2e-006, TUR 41.667 (>= 4.00). 16.001 5700 -5.0000V S 2W 16.002 IEEE [I] 16.003 MEME 16.004 MEMC V 0.0009U #! Test Tol 0.0009, Sys Tol 2.9e-005, TUR 31.034 (>= 4.00). 17.001 5700 -10.0000V S 2W 17.002 IEEE [I] 17.003 MEME 17.004 MEMC V 0.0016U #! Test Tol 0.0016, Sys Tol 5.4e-005, TUR 29.630 (>= 4.00). 18.001 HEAD {100 Volt Range} 18.002 JMP 19.001 18.003 EVAL 19.001 IEEE VR4[13][10] 19.002 5700 100.000V S 2W 19.003 IEEE [I] 19.004 MEME 19.005 MEMC V 0.016U #! Test Tol 0.016, Sys Tol 0.0007, TUR 22.857 (>= 4.00). 20.001 HEAD 20.002 DISP Disconnect the test setup. 20.003 HEAD {} 20.004 HEAD {* DC CURRENT SOURCE TEST *} 20.005 HEAD DC CURRENT SOURCE TEST 20.006 JMP 21.001 20.007 EVAL 21.001 ASK- N W 21.002 DISP Connect the UUT CURRENT SOURCE HI/LO outputs to the 21.002 DISP outer screw terminal connections on the Leeds & 21.002 DISP Northrup 1000 ohm standard resistor. 21.003 DISP Connect the inner screw terminal connections 21.003 DISP on the standard resistor to the HI/LO INPUTS 21.003 DISP on the 34401A. Be sure to observe polarity. 21.004 MEMI Enter the calibrated value for the standard resistor 21.005 MEME >1 21.006 IEEE [SDC][D3000] 21.007 IEEE VC3[13][10][D2000] 21.008 34401 1.0000V N 2W 21.009 ACC 1.00000mA 0.006% 21.010 MATH mem = (mem / m[1]) * 1e3 21.011 MEME 21.012 MEMC mA 0.032% #! Test Tol 0.00032, Sys Tol 2.9e-005, TUR 11.034 (>= 4.00). 22.001 IEEE VC2[13][10] 22.002 34401 0.10000V N 2W 22.003 ACC 100.0000uA 0.006% 22.004 MATH mem = (mem / m[1]) * 1e6 22.005 MEME 22.006 MEMC uA 0.032% #! Test Tol 0.032, Sys Tol 0.0029, TUR 11.034 (>= 4.00). 23.001 IEEE VC1[13][10] 23.002 34401 0.010000V N 2W 23.003 ACC 10.0000uA 0.006% 23.004 MATH mem = (mem / m[1]) * 1e6 23.005 MEME 23.006 MEMC uA 0.032% #! Test Tol 0.0032, Sys Tol 0.00065, TUR 4.923 (>= 4.00). 24.001 IEEE VC0[13][10] 24.002 HEAD {} 24.003 END #! T.U.R.s less than 4.00: 0 #! T.U.R.s estimated using RANGE value: 0 #! T.U.R.s not calculated (ASK- U): 0 #! T.U.R.s not computable at compile time: 0 #! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.